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Scanning electron microscopy principle


Scanning electron microscopes (SEMs) use an electron beam to image samples with a resolution down to the nanometer scale. The electrons are emitted from a filament and collimated into a beam in the electron source. The beam is then focused on the sample surface by a set of lenses in the electron column.

What is the working principle of scanning electron microscopy?

The electron beam follows a vertical path through the microscope, which is held within a vacuum. The beam travels through electromagnetic fields and lenses, which focus the beam down toward the sample. Once the beam hits the sample, electrons and X-rays are ejected from the sample.

Which principle is used in electron microscope?

Electron microscope is based on the principle of De-Broglie hypothesis of wave-nature of electrons.

What is the main function of SEM?

A scanning electron microscope (SEM) projects and scans a focused stream of electrons over a surface to create an image. The electrons in the beam interact with the sample, thereby producing various signals that can be used to obtain information about the surface's topography and composition.

What is the basic principle in scanning electron microscope How are they different from optical microscopy explain?

The main difference between a Scanning Electron Microscope (SEM) and an Optical Microscope (OM) is the type of beam applied to the sample. For optical microscopy, a beam of light is applied to the sample, allowing the observer to analyze the effects of light as it interacts with the sample.




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