What is SEM TEM?
SCANNING ELECTRON MICROSCOPY (SEM) TRANSMISSION ELECTRON MICROSCOPY (TEM) 1 SEM provides information on the sample’s surface and its composition. SEMs use a specific set of coils to scan the beam in a raster-like pattern and collect the scattered electrons.
What are the scattered electrons in SEM and TEM?
The scattered electrons in SEM are classified as backscattered or secondary electrons. However, there is no other classification of electrons in TEM. The scattered electrons in SEM produced the image of the sample after the microscope collects and counts the scattered electrons.
What is the difference between SEM and STEM mode?
In STEM mode, the beam is finely focused and scans the sample area (as SEM does), while the image is generated by the transmitted electrons (like in TEM). When working in STEM mode, the users can take advantage of the capabilities of both techniques.