Serial femtosecond crystallography time-resolved

  • What is the electron density equation for crystallography?

    ρ(xyz)=.

    1. V∑hklF(hkl)exp[−2πi(hx+ky+lz)].
      2. The electron density map describes the contents of the unit cells averaged over the whole crystal and not the contents of a single unit cell (a distinction that is important where structural disorder is present).

  • Which region of the diffraction pattern gives the highest resolution in crystallography?

    The resolution of spots collected on the detector increases as the diffracted angle increases.
    Hence, the highest resolution will be at the edge of the detector, and if one determines the diffracted angle required, the distance of the detector from the crystal can be adjusted accordingly..

In time-resolved SFX (TR-SFX) a reaction in a microcrystal is initiated with an optical laser during sample delivery into the X-ray interaction volume, and the progress of the reaction is probed after a time delay Δt by the pulsed XFEL beam, as pioneered at the Linac Coherent Light Source (LCLS) at 120 Hz (refs. 3,4,13
Time-resolved serial femtosecond crystallography (tr-SFX) methods exploit slurries of crystalline samples that range in size from hundreds of nanometers to a few tens of micrometers, at near-physiological temperature and pressure, to generate atomic resolution models and probe authentic function with the same
Time-resolved serial femtosecond crystallography (tr-SFX) methods exploit slurries of crystalline samples that range in size from hundreds of nanometers to a few tens of micrometers, at near-physiological temperature and pressure, to generate atomic resolution models and probe authentic function with the same

What is femtosecond crystallography (tr-SFX)?

Time-resolved serial femtosecond crystallography (tr-SFX) probes structure and function in each sample

X-ray free electron lasers (XFELS) provide atomic and electronic structures with femtosecond temporal resolution

Correlated multidisciplinary datasets provide deep mechanistic insights

What is time-resolved Serial femtosecond crystallography (tr-SFX)?

Time-resolved serial femtosecond crystallography (tr-SFX) methods exploit slurries of crystalline samples that range in size from hundreds of nanometers to a few tens of micrometers, at near-physiological temperature and pressure, to generate atomic resolution models and probe authentic function with the same experiment


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Serial femtosecond crystallography experiment
Gemmi crystallography
Geometrical crystallography symmetry elements
Generalized crystallography
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The crystallography of correlated disorder
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John helliwell crystallography
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X ray crystallography lecture notes
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