What is the principle of SEM?
The SEM is an instrument that produces a largely magnified image by using electrons instead of light to form an image. A beam of electrons is produced at the top of the microscope by an electron gun. The electron beam follows a vertical path through the microscope, which is held within a vacuum.
What is scanning electron microscopy used for?
scanning electron microscope (SEM), type of electron microscope, designed for directly studying the surfaces of solid objects, that utilizes a beam of focused electrons of relatively low energy as an electron probe that is scanned in a regular manner over the specimen.
Which detector is used in SEM?
Backscattered electron detector (BSD)\n\n In scanning electron microscopy (SEM), samples are imaged using a focused electron beam that is rastered across a surface. Different types of electrons are emitted from samples. A backscattered electron detector (BSD) detects elastically scattered electrons.
What is the principle of scanning?
Scanning electron microscopy principles\n\n The electrons are emitted from a filament and collimated into a beam in the electron source. The beam is then focused on the sample surface by a set of lenses in the electron column.
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