LONGITUDINAL ESTABLISHMENT AND ENTERPRISE MICRODATA (LEEM
The LEEM links three years (1990, 1994, and 1995) of basic data for each private sector establishment with payroll in any of those years, along with data on the firm to which the establishment belongs each year
Low-energy electron microscopy and spectroscopy with ESCHER
LEEM experiment, the electrons follow the optical axis indicated in purple and red in Figure 1(c) The cold field-emission gun generates an electron beam with an energy of 15 keV A combination of a gun lens and a condenser lens serves to focus the electron beam with variable magnification Next, a magnetic prism array, with electron
Self-Regulation: Ethics Surveillance and - leemorg
The ^Ethical usiness Provisions Applicable to Pharmaceutical Professionals and Members of the Leem (DDP) are recommendations on responsible business practices concerning health and the environment, created by the Leem in September 2011 and updated on 31 March 2012 and on 29 January 2013
Chapter 9 Electron mean free path Microscopy principles of
IBM LEEM II Surf Reviews and Lett 5 (1998) 1189 After diffraction, electrons are accelerated from ~ 1 eV to ~ 10,000 eV Chapter 9 20 LEEM operating parameters • 0 - 100 eV electron energy • field of view 1 - 100 µm • 5 nm resolution in plane • vertical resolution: atomic steps, 0 1 nm • in situ growth, etching • RT – 1200 oC
The French Pharmaceutical Companies Association - leemorg
The Leem wishes to stress that medicinal products are marketed after a particularly demanding development process, in view of the favourable benefit-risk ratio, reevaluated regularly by the health authorities
Spin-polarized low energy electron microscopy of
A number of years ago, when LEEM was already well established, Professor Moellenstaedt told one of the authors that he had serious doubts initially that LEEM would ever work but nevertheless recommended funding of the further development of the instrument This paper is dedicated to his memory and is a thank for his support Introduction
Probing substrate-dependent long-range surface structure of
2 in this LEEM image Despite this “grounding” grid, local charging of the sample effectively prevented LEEM under continuous electron beam illumination The very low mobility of MoS 2 (
Computation and measurement of aberrations in low energy
IBM/SPEC (AC)-LEEM/PEEM Design: ~30 instruments soldgun condenser lenses prism array projector lenses objective lens sample screen R M Tromp, M Mankos, M C Reuter, A W Ellis, M Copel Surface Review and Letters 5 , 1189 (1998)
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